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Effect of dielectric thin films on reflection properties of metal hole arrays
http://hdl.handle.net/10091/10750
http://hdl.handle.net/10091/1075063e103b9-20ae-44f9-bd04-ecb567c21fb2
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2010-11-02 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Effect of dielectric thin films on reflection properties of metal hole arrays | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | dielectric thin films | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | metallic thin films | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | terahertz wave detectors | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | terahertz wave spectra | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
Miyamaru, Fumiaki
× Miyamaru, Fumiaki× Sasagawa, Yuki× Takeda, Mitsuo Wada |
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信州大学研究者総覧へのリンク | ||||||
氏名 | Miyamaru, Fumiaki | |||||
URL | http://soar-rd.shinshu-u.ac.jp/profile/ja.HVSNOakh.html | |||||
信州大学研究者総覧へのリンク | ||||||
氏名 | Takeda, Mitsuo Wada | |||||
URL | http://soar-rd.shinshu-u.ac.jp/profile/ja.gmkVPVAU.html | |||||
出版者 | ||||||
出版者 | AMER INST PHYSICS | |||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | APPLIED PHYSICS LETTERS. 96(2):021106 (2010) | |||||
書誌情報 |
APPLIED PHYSICS LETTERS 巻 96, 号 2, 発行日 2010-01-11 |
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内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in APPLIED PHYSICS LETTERS. 96(2):021106 (2010) and may be found at https://doi.org/10.1063/1.3292024 . | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We study the effect of a dielectric film attached to the surface of a metal hole array (MHA) on the reflection spectrum in the terahertz (THz) region. The frequency of the reflection dip, attributed to the excitation of surface waves in the vicinity of the MHA surface, shifts to lower frequencies with increasing dielectric film thickness. This resonant characteristic of MHAs can be applied to highly sensitive THz sensing for samples attached to the MHA surface. We also investigate the dependence of the reflection spectrum on the MHA's thickness and the side to which the dielectric film is attached. | |||||
資源タイプ(コンテンツの種類) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Article | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0003-6951 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00543431 | |||||
他の資源との関係:URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://apl.aip.org/ | |||||
関連名称 | http://apl.aip.org/ | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1063/1.3292024 | |||||
関連名称 | 10.1063/1.3292024 | |||||
権利 | ||||||
権利情報 | Copyright© 2010 American Institute of Physics. | |||||
出版タイプ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
WoS | ||||||
表示名 | Web of Science | |||||
URL | http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=ShinshuUniv&SrcApp=ShinshuUniv&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000273689400006 |