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Robust 3D Planes Detection under Noisy Conditions Using Scaled Difference of Normals
http://hdl.handle.net/10091/00022719
http://hdl.handle.net/10091/000227196a7cd94a-8430-4d05-9984-50f855171a01
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||||||||||
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公開日 | 2021-02-22 | |||||||||||||
タイトル | ||||||||||||||
タイトル | Robust 3D Planes Detection under Noisy Conditions Using Scaled Difference of Normals | |||||||||||||
言語 | ||||||||||||||
言語 | eng | |||||||||||||
DOI | ||||||||||||||
関連識別子 | https://doi.org/10.11371/tievciieej.5.2_60 | |||||||||||||
関連名称 | 10.11371/tievciieej.5.2_60 | |||||||||||||
キーワード | ||||||||||||||
主題 | 3D point clouds, planes detection, model fitting, Hough transform, RANSAC | |||||||||||||
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資源 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
タイプ | journal article | |||||||||||||
著者 |
SANDOVAL, Jaime
× SANDOVAL, Jaime
× UENISHI, Kazuma
× IWAKIRI, Munetoshi
× TANAKA, Kiyoshi
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信州大学研究者総覧へのリンク | ||||||||||||||
氏名 | TANAKA, Kiyoshi | |||||||||||||
URL | https://soar-rd.shinshu-u.ac.jp/profile/ja.WUnUbpkh.html | |||||||||||||
出版者 | ||||||||||||||
出版者 | The Institute of Image Electronics Engineers of Japan | |||||||||||||
引用 | ||||||||||||||
内容記述 | IIEEJ Transactions on Image Electronics and Visual Computing.5(2):60-73(2017) | |||||||||||||
書誌情報 |
IIEEJ Transactions on Image Electronics and Visual Computing 巻 5, 号 2, p. 60-73, 発行日 2017-12-15 |
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抄録 | ||||||||||||||
内容記述 | 3D planes detection is an important task that has numerous applications in urban environments. However, current methods do not deal appropriately with the noise and quantization artifacts of low-cost sensors. In this paper, we present the Scaled Difference of Normals, a points filter that addresses these issues and is implemented on top of the Fast and Deterministic Planes Detection Based on Hough Transform. We evaluated its precision by comparing the detected planes coefficients with semi-automatically generated ground truth data and confirmed that when compared to state of the art methods, the proposed method is fast and has superior precision even in the presence of high noise levels, quantization artifacts and several variations in the points distribution caused by registration. | |||||||||||||
資源タイプ(コンテンツの種類) | ||||||||||||||
ISSN | ||||||||||||||
収録物識別子タイプ | ISSN | |||||||||||||
収録物識別子 | 2188-1898 | |||||||||||||
権利 | ||||||||||||||
権利情報 | © 2017 The Institute of Image Electronics Engineers of Japan. | |||||||||||||
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出版タイプ | VoR | |||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |